Failure Rate Summary

Device Reliability Report (UG116)

Table 1. Summary of the Failure Rates
Process Technology	Device Hours at T_J = 125°C	FIT¹
7 nm	1,030,655	11
16 nm	1,075,774	11
20 nm	1,040,986	11
28 nm	1,089,800	11
40 nm	1,107,040	11
45 nm	1,042,254	11
65 nm	1,106,315	11
90 nm	7,499,862	2
180 nm	1,082,919	11
220 nm/180 nm	1,000,645	12
350 nm/250 nm	1,137,973	10
350 nm	1,010,470	12
FIT is calculated based on 0.7 eV (0.58 eV for EPROM), 60% C.L. and T_J of 55°C.