Reliability Data for Pb-Free Packages

Device Reliability Report (UG116)

Document ID
UG116
Release Date
2023-05-17
Revision
10.17 English

CLG400 and CLG484

Table 1. Test Results for Device Type XC7Z020
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 7 0 309 163,152
HTS 6 0 265 530,000
Temperature cycling

–55°C to +125°C

7 0 284 568,000

CPG132

Table 2. Test Results for Device Type XC3S500E
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 4 0 180 270,000
Temperature cycling

–55°C to +125°C

4 0 159 238,500
THB 4 0 179 268,500

CSG324

Table 3. Test Results for Device Type XC6SLX45
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 4 0 180 71,280
HTS 4 0 180 315,00
Temperature cycling

–55°C to +125°C

4 0 160 320,000

FFG1136, FFG1148, FFG1152, FFG1153, FFG1154, FFG1155, FFG1156, FFG1157 and FFG1158

Table 4. Test Results for Device Type XC6VLX240T and XC5VLX110T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 7 0 313 469,500
Temperature cycling

–55°C to +125°C

7 0 314 471,000
THB 7 0 315 450,000

FFV1136, FFV1148, FFV1152, FFV1153, FFV1154, FFV1155, FFV1156, FFV1157 and FFV1158

Table 5. Test Results for Device Type XCKU15P, XCZU15EG, XCKU060, XCKU025, XCKU040, XCZU9EG
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 16 0 716 1,074,000
Temperature cycling

–55°C to +125°C

16 0 709 1,041,000
THB 14 0 623 912,000

FF1696_1704_1738_1759_1760_1761

Table 6. Test Results for Device Type XC6VLX240T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 1 0 45 67,500
Temperature cycling

–55°C to +125°C

1 0 45 67,500

FFG_1923_1924_1925_1926_1927_1928_1929_1930

Table 7. Test Results for Device Type XC6VHX380T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
THB 1 0 45 67,500

FFV1517_1924_2104

Table 8. Test Results for Device Type XCVU095
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling

–55°C to +125°C

6 0 268 379,500

FGG324_456

Table 9. Test Results for Device Type XC3S400 and XC3S1000
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 3 0 135 202,500
Temperature cycling

–55°C to +125°C

2 0 80 120,000
THB 4 0 180 225,000

FGG484

Table 10. Test Results for Device Type XC7A35T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 4 0 179 94,512

FGG676

Table 11. Test Results for Device Type XC7A100T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 4 0 177 265,500
Temperature cycling

–55°C to +125°C

4 0 158 237,000

FHG1761 and FHG2104

Table 12. Test Results for Device Type XCVU13P
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 8 0 358 537,000
Temperature cycling

–55°C to +125°C

8 0 351 481,500

FLV_1517_1924_2104

Table 13. Test Results for Device Type XCKU115
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
THB 5 0 225 337,500

FSV1156

Table 14. Test Results for Device Type XCZU27DR
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 1 0 76 152,000
Temperature cycling

–55°C to +125°C

1 0 44 66,000

FSV2892

Table 15. Test Results for Device Type XCVU37P and XCVU47P
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 1 0 43 64,500
Temperature cycling

–55°C to +125°C

1 0 25 37,500

FTG196

Table 16. Test Results for Device Type XC7S50
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 2 0 88 132,000
Temperature cycling

–55°C to +125°C

2 0 80 120.000
THB 2 0 90 112,500

FTG256

Table 17. Test Results for Device Type XC3S1200E, XC3S200A
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 2 0 90 47,520
HTS 6 0 266 487,000
Temperature cycling

–55°C to +125°C

6 0 235 A430,000
THB 4 0 177 354,000

NBV1024

Table 18. Test Results for Device Type XCVM1402
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling

–55°C to +125°C

6 0 82 82,000

NSV1369

Table 19. Test Results for Device Type XCVM1402
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling

–55°C to +125°C

4 0 58 58,000

SFV625

Table 20. Test Results for Device Type XCZU3EG
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 8 0 358 716,000
Temperature cycling

–55°C to +125°C

8 0 358 716,000
THB 6 0 261 522,000

VQG_All

Table 21. Test Results for Device Type XC3S100E and XC3S250E
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 4 0 180 270,000
Temperature cycling

–55°C to +125°C

4 0 160 240,000
THB 4 0 175 262,500

VSV1596_1760

Table 22. Test Results for Device Type XCVC1702 and XCVC1902
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling

–55°C to +125°C

12 0 171 171,000

VFV1760

Table 23. Test Results for Device Type XCVM1802
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling

–55°C to +125°C

6 0 75 750,000

VSV2197

Table 24. Test Results for Device Type XCVC1902
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 4 0 180 270.000
Temperature cycling

–55°C to +125°C

4 0 172 245,100
THB 4 0 179 268,500

VSV2785

Table 25. Test Results for Device Type XCVP1202
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling

–55°C to +125°C

6 0 142 142,000