In this section, try to use a different set of metrics in the xrt.ini
file and generate another xrt.run_summary
file. Open the second run_summary on top of the first summary.
Save the profile data obtained from the first run (step 1-3) to a directory
profile_0
in your local workspace.Edit the
xrt.ini
file in SD_card with the following content, and reboot the board:[Debug] aie_profile = true [AIE_profile_settings] interval_us = 1000 graph_based_aie_metrics = all:all:execution tile_based_aie_memory_metrics = all:dma_locks tile_based_interface_tile_metrics = all:output_throughputs:0
Move the obtained profile data in the directory,
profile_2
, in a local workspace.Open the first profile run summary file in the Vitis Analyzer as explained in step 4.
Add the second profile run summary file to the existing
run_summary
file using the+
option as shown below. Observe the combined metrics of first run with theheat_map
,conflicts
, andinput_throughputs
metrics and the second run withexecution
,dma_locks
, andoutput_bandwidth
metrics in the Vitis Analyzer.Click on % to toggle between the absolute and percentage values of the collected design metrics.
Click the column header to sort the data within those rows. Click once to display the selected row data in ascending order. Click twice to display the selected row data in descending order. Click three times to disable the sorting function.