Latent Fault Detection

Versal ACAP Technical Reference Manual (AM011)

Document ID
AM011
Release Date
2022-04-26
Revision
1.4 English

The detection of latent faults is supported with these features:

  • All check logic such as XMPU, lockstep, and ECC checkers are checked at boot by LBIST
  • All LPD memories can be tested at full-processing speed during boot by MBIST
    • Most of these memories (excluding PPU and RCU RAMs) can be tested on demand during execution
  • The functionality and status of TCM, OCM, PPU RAM, RPU lockstep, PPU, XMPU, XPPU, clocks, voltages, and temperatures can be tested and evaluated through the dedicated software test library (STL)