Testability Functions - 2.6 English

UltraScale Devices Integrated 100G Ethernet Subsystem Product Guide (PG165)

Document ID
PG165
Release Date
2023-06-15
Version
2.6 English

The 100G Ethernet example design implements the test pattern generation and checking as defined in Clause 82.2.10 (Test-pattern generators) and Clause 82.2.17 (Test-pattern checker). See the IEEE 802.3 documents for details.