Testability Functions - 3.1 English

UltraScale+ Devices Integrated 100G Ethernet Subsystem Product Guide (PG203)

Document ID
PG203
Release Date
2022-11-02
Version
3.1 English

The 100G Ethernet example design implements the test pattern generation and checking as defined in Clause 82.2.10 (Test-pattern generators) and Clause 82.2.17 (Test-pattern checker). See the IEEE 802.3 documents for details.