Zynq UltraScale+ Device Technical Reference Manual (UG1085)

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2.4 English

The system test and debug features provide intrusive and non-intrusive functionality of an interconnected PS and PL system to debug RPU and APU application software. There are other system elements ign the PS and user-selected hardware elements in the PL that can be included in the debug environment.

This chapter is divided between the JTAG interfaces with the Arm DAP, PS TAP, and PL TAP controllers, and the CoreSight system debug functionality. The CoreSight debug functions are accessible by the Arm DAP controller or by system masters accessing the memory-mapped debug registers. The PS TAP controller is alway present and has system functions. The PL TAP controller provides boundary scan (BSCAN) and PL programming functions.