PUF Characterization, Testing, and Ordering

Zynq UltraScale+ Device Technical Reference Manual (UG1085)

Document ID
UG1085
Release Date
2022-09-15
Revision
2.3 English

The Zynq UltraScale+ MPSoC PUF Characterization Report (RPT236) is a Xilinx proprietary document that covers additional characterization testing performed on the PUF. This characterization covers the PUF's stability (i.e., ability to accurately regenerate the KEK) over the voltage, temperature, and aging. It also covers characterization of the entropy, or security strength, of the KEK. Contact your local Xilinx FAE or sales person for details on how to obtain a copy of the report.

Special ordering codes are required for devices where additional manufacturing tests have been performed on the PUF to help ensure entropy (i.e., key strength).