The High-Temperature Storage Life test is conducted under the conditions of
150°C and with the device unbiased.
Summary
Table 1. Summary of High Temperature Storage Life Test Results
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC3Sxxx |
3 |
0 |
135 |
202,500 |
| XC3SxxxA |
2 |
0 |
90 |
135,000 |
| XC3SxxxE |
12 |
0 |
536 |
892,000 |
| XC5VxXxxx |
4 |
0 |
180 |
270,000 |
| XC6Sxxx |
4 |
0 |
180 |
315,000 |
| XC6VxXxxx |
4 |
0 |
178 |
267,000 |
| 7 series FPGAs and Zynq-7000 SoCs |
12 |
0 |
530 |
927,500 |
| UltraScale devices |
8 |
0 |
359 |
538,500 |
| UltraScale+ devices |
25 |
0 |
1149 |
1,940,500 |
| Versal devices |
4 |
0 |
180 |
270,000 |
Data
Table 2. Summary of High-Temperature Storage Life Test Results XC3Sxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC3S1000 |
3 |
0
|
135 |
202,500 |
| XC3Sxxx |
3 |
0
|
135 |
202,500 |
Table 3. Summary of High-Temperature Storage Life Test Results XC3SxxxA
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC3S200A |
2 |
0
|
90 |
135,000 |
| XC3SxxxA |
2 |
0
|
90 |
135,000 |
Table 4. Summary of High-Temperature Storage Life Test Results XC3SxxxE
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC3S100E |
1 |
0
|
45 |
67,500 |
| XC3S1200E |
4 |
0
|
176 |
352,000 |
| XC3S250E |
3 |
0
|
135 |
202,500 |
| XC3S500E |
4 |
0
|
180 |
270,000 |
| XC3SxxxE |
12 |
0
|
536 |
892,000 |
Table 5. Summary of High-Temperature Storage Life Test Results XC5VxXxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC5VLX110T |
4 |
0
|
180 |
270,000 |
| XC5VxXxxx |
4 |
0
|
180 |
270,000 |
Table 6. Summary of High-Temperature Storage Life Test Results XC6Sxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC6SLX45 |
4 |
0
|
180 |
315,000 |
| XC6Sxxx |
4 |
0
|
180 |
315,000 |
Table 7. Summary of High-Temperature Storage Life Test Results XC6VxXxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC6VLX240T |
4 |
0
|
178 |
267,000 |
| XC6VxXxxx |
4 |
0
|
178 |
267,000 |
Table 8. Summary of High-Temperature Storage Life Test Results 7 series FPGAs and Zynq-7000 SoCs
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC7A100T |
4 |
0
|
177 |
265,500 |
| XC7S50 |
2 |
0
|
88 |
132,000 |
| XC7Z020 |
6 |
0
|
265 |
530,000 |
| 7 series FPGAs and Zynq-7000 SoCs |
12 |
0
|
530 |
927,500 |
Table 9. Summary of High-Temperature Storage Life Test Results UltraScale devices
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XCKU025 |
1 |
0
|
45 |
67,500 |
| XCKU040 |
5 |
0
|
224 |
336,000 |
| XCKU060 |
2 |
0
|
90 |
135,000 |
| UltraScale devices |
8 |
0
|
359 |
538,500 |
Table 10. Summary of High-Temperature Storage Life Test Results UltraScale+ devices
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XCVU13P |
8 |
0
|
358 |
537,000 |
| XCZU15EG |
4 |
0
|
180 |
270,000 |
| XCZU27DR |
1 |
0
|
76 |
152,000 |
| XCZU3EG |
8 |
0
|
358 |
716,000 |
| XCZU9EG |
4 |
0
|
177 |
265,500 |
| UltraScale+ devices |
25 |
0
|
1149 |
1,940,500 |
Table 11. Summary of High-Temperature Storage Life Test Results Versal devices
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XCVC1902 |
4 |
0
|
180 |
270,000 |
| Versal devices |
4 |
0
|
180 |
270,000 |